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Stuck-At Fault Mitigation of Emerging Technologies Based Switching Lattices

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Abstract

Switching lattices are two-dimensional arrays composed of two or four-terminals switches organized as a crossbar array. The idea of using regular two-dimensional arrays of switches for Boolean function implementation was proposed by Akers in 1972. Recently, with the advent of a variety of emerging nanoscale technologies, lattices have found a renewed interest. Emerging technologies allow more complex function integration, thanks to their smaller sizes and advanta geous properties such as zero leakage current, capability to retain data when in power-off state, and almost unlimit edendurance, to name just a few appealing features. Also, implementation of new computing paradigms combining memory and logic becomes possible. However, emerging technologies show a non-negligible defect ratio and higher sensitivity to process and environment variations. The reliability challenges in adopting these technologies need to be investigated. In this paper, we analyze the resilience of switching lattices to stuck-at-fault model (SAF). We first identify the critical switches through an elaborated sensitivity methodology and extensive analysis of the lattice. Next, we propose several techniques to improve lattice resilience in the face of these types of faults, that can be implemented after lattice logic optimization steps.

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Acknowledgments

This research is funded by the European Union Horizon 2020 research and innovation programme under the Marie Skłsodowska-Curie grant agreement No 691178.

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Authors and Affiliations

  1. Institute of Engineering University Grenoble Alpes, University Grenoble Alpes, CNRS, Grenoble INP TIMA, 38000, Grenoble, France

    Lorena Anghel & Ioana Vatajelu

  2. Dipartimento di Informatica, Università di Pisa, Pisa, Italy

    Anna Bernasconi

  3. Dipartimento di Informatica, Università degli Studi di Milano, Milano, Italy

    Valentina Ciriani & Gabriella Trucco

  4. INFN Milano, Milano, Italy

    Luca Frontini

Authors
  1. Lorena Anghel
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  2. Anna Bernasconi
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  3. Valentina Ciriani
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  4. Luca Frontini
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  5. Gabriella Trucco
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  6. Ioana Vatajelu
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Correspondence to Lorena Anghel.

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Responsible Editor: L. M. Bolzani Pöhls

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Anghel, L., Bernasconi, A., Ciriani, V. et al. Stuck-At Fault Mitigation of Emerging Technologies Based Switching Lattices. J Electron Test 36, 313–326 (2020). https://doi.org/10.1007/s10836-020-05885-2

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  • DOI: https://doi.org/10.1007/s10836-020-05885-2

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