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Link to original content: https://unpaywall.org/10.1007/978-3-030-92310-5_88
Attend to Your Review: A Deep Neural Network to Extract Aspects from Peer Reviews | SpringerLink
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Attend to Your Review: A Deep Neural Network to Extract Aspects from Peer Reviews

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Neural Information Processing (ICONIP 2021)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 1517))

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Abstract

Peer-review process is fraught with issues like bias, inconsistencies, arbitrariness, non-committal weak rejects, etc. However, it is anticipated that the peer reviews provide constructive feedback to the authors against some aspects of the paper such as Motivation/Impact, Soundness/Correctness, Novelty, Substance, etc. A good review is expected to evaluate a paper under the lens of these aspects. An automated system to extract these implicit aspects from the reviews would help determine the quality/goodness of the peer review. In this work, we propose a deep neural architecture to extract the aspects of the paper on which the reviewer commented in their review. Our automatic aspect-extraction model based on BERT and neural attention mechanism achieves superior performance over the standard baselines. We make our codes, analyses and other matrials available at https://github.com/cruxieu17/aspect-extraction-peer-reviews.

R. Verma and K. Shinde—Equal contribution.

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Change history

  • 02 December 2021

    In the originally published version of chapter 88 the acknowledgement statement was erroneously omitted. The acknowledgement statement has been added to the chapter.

Notes

  1. 1.

    https://openreview.net/.

  2. 2.

    https://openreview.net/forum?id=HkGJUXb0-&noteId=ry_11ijeM.

  3. 3.

    https://github.com/cruxieu17/aspect-extraction-peer-reviews/blob/main/review_2.txt.

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Acknowledgement

Tirthankar Ghosal is funded by Cactus Communications, India (Award # CAC-2021-01) to carry out this research.

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Correspondence to Kartik Shinde .

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Verma, R., Shinde, K., Arora, H., Ghosal, T. (2021). Attend to Your Review: A Deep Neural Network to Extract Aspects from Peer Reviews. In: Mantoro, T., Lee, M., Ayu, M.A., Wong, K.W., Hidayanto, A.N. (eds) Neural Information Processing. ICONIP 2021. Communications in Computer and Information Science, vol 1517. Springer, Cham. https://doi.org/10.1007/978-3-030-92310-5_88

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  • DOI: https://doi.org/10.1007/978-3-030-92310-5_88

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-92309-9

  • Online ISBN: 978-3-030-92310-5

  • eBook Packages: Computer ScienceComputer Science (R0)

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