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On_line Measurement System of Virtual Dielectric Loss Based on Wavelets and LabVIEW and Correlation Technics | SpringerLink
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On_line Measurement System of Virtual Dielectric Loss Based on Wavelets and LabVIEW and Correlation Technics

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Computational Intelligence and Security (CIS 2005)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 3801))

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Abstract

This paper presents the principles and instrument structures of on_line measurement system for dielectric loss of virtual capacitive_type equipment. The system based on wavelets, LabVIEW, GPRS network and SPC correlation technics, which can efficiently solve the problem of eliminating noises from signals, removing the electromagnetism interference to measure the results of influence, global area and full auto on_line measurement, to attain the higher precision of measurement.

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References

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Author information

Authors and Affiliations

  1. School of Computer Science and Engineering, Xidian University, Xi’an, 710071, China

    BaoBao Wang & Ye Wang

Authors
  1. BaoBao Wang
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  2. Ye Wang
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Editor information

Editors and Affiliations

  1. Microelectronic Instiute, Xidian University, 710071, Xi’an, China

    Yue Hao

  2. Department of Computer Science, Hong Kong Baptist University, Kowloon Tong, Hong Kong

    Jiming Liu

  3. School of Computer Science and Technology, Xidian University, Xi’an, China

    Yuping Wang

  4. Department of Computer Science, Hong Kong Baptist University, Hong Kong,  

    Yiu-ming Cheung

  5. School of Electrical and Electronic Engineering, University of Manchester, UK

    Hujun Yin

  6. Life Science Research Center, School of Electronic Engineering, Xidian University, 710071, Xi’an, Shaanxi, China

    Licheng Jiao

  7. Key Laboratory of Computer Networks and Information Security (Ministry of Education), Xidian University, 710071, Xi’an, China

    Jianfeng Ma

  8. National Laboratory of Antennas and Microwave Technology, Xidian University, 710071, Xi’an, Shanxi, P.R. China

    Yong-Chang Jiao

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© 2005 Springer-Verlag Berlin Heidelberg

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Cite this paper

Wang, B., Wang, Y. (2005). On_line Measurement System of Virtual Dielectric Loss Based on Wavelets and LabVIEW and Correlation Technics. In: Hao, Y., et al. Computational Intelligence and Security. CIS 2005. Lecture Notes in Computer Science(), vol 3801. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11596448_49

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  • DOI: https://doi.org/10.1007/11596448_49

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-30818-8

  • Online ISBN: 978-3-540-31599-5

  • eBook Packages: Computer ScienceComputer Science (R0)

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