Metalorganic vapor phase epitaxial growth of a high quality GaN film using an AlN buffer layer
Abstract
Atmospheric pressure metalorganic vapor phase epitaxial growth and characterization of high quality GaN on sapphire (0001) substrates are reported. Using AlN buffer layers, GaN thin films with optically flat surfaces free from cracks are successfully grown. The narrowest x-ray rocking curve from the (0006) plane is 2.70' and from the (202¯4) plane is 1.86'. Photoluminescence spectra show strong near band edge emission. The growth condition dependence of crystalline quality is also studied.
- Publication:
-
Applied Physics Letters
- Pub Date:
- February 1986
- DOI:
- Bibcode:
- 1986ApPhL..48..353A
- Keywords:
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- Aluminum Nitrides;
- Gallium Nitrides;
- Thin Films;
- Vapor Phase Epitaxy;
- Light Emitting Diodes;
- Organometallic Compounds;
- X Ray Analysis;
- Solid-State Physics