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Link to original content: https://doi.org/10.20965/ijat.2015.p0494
IJAT Vol.9 p.494 (2015) | Fuji Technology Press: academic journal publisher
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IJAT Vol.9 No.5 pp. 494-501
doi: 10.20965/ijat.2015.p0494
(2015)

Paper:

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Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales

Qinghua Wang*, Hiroshi Tsuda*, Satoshi Kishimoto**, Yoshihisa Tanaka**, and Yutaka Kagawa**,***

*Research Institute for Measurement and Analytical Instrumentation,
National Institute of Advanced Industrial Science and Technology
1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan

**Hybrid Materials Unit, National Institute for Materials Science
1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan

***Research Center for Advanced Science and Technology, The University of Tokyo
4-6-1 Komaba, Meguro-ku, Tokyo 153-0041, Japan

Received:
January 31, 2015
Accepted:
March 30, 2015
Published:
September 5, 2015
Creative Commons License
Keywords:
laser scanning microscope, moiré method, overlapping, secondary moiré, deformation measurement
Abstract
This paper presents two up-to-date moiré techniques for deformation measurement based on the memory function of a laser scanning microscope (LSM). The two techniques are the LSM overlapping moiré method and the LSM secondary moiré method. The formation principles and the measurement principles of these two methods are presented and compared to those of the traditional scanning moiré method for the first time. The applicable conditions and characteristics of these three moiré techniques are analyzed. Some typical moiré fringes on a strain gauge, carbon fiber reinforced plastics, a polyimide film, and a silicon wafer are illustrated. Our proposed LSM overlapping moiré method and LSM secondary moiré method are able to expand the application range of the LSM in deformation measurement to the micron and the submicron scales.
Cite this article as:
Q. Wang, H. Tsuda, S. Kishimoto, Y. Tanaka, and Y. Kagawa, “Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales,” Int. J. Automation Technol., Vol.9 No.5, pp. 494-501, 2015.
Data files:
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