iBet uBet web content aggregator. Adding the entire web to your favor.
iBet uBet web content aggregator. Adding the entire web to your favor.



Link to original content: https://doi.org/10.1145/2897937.2898006
Designing guardbands for instantaneous aging effects | Proceedings of the 53rd Annual Design Automation Conference skip to main content
10.1145/2897937.2898006acmotherconferencesArticle/Chapter ViewAbstractPublication PagesdacConference Proceedingsconference-collections
research-article

Designing guardbands for instantaneous aging effects

Published: 05 June 2016 Publication History

Abstract

Bias Temperature Instability (BTI) is one of the key causes of reliability degradations of nano-CMOS circuits. While the long-term impact of BTI has been studied since years, the short-term implications of BTI on circuits are unexplored. In fact, in physics short-term BTI effects, i.e. instantaneous (i.e. sub μs) frequency dependent processes, have been recently reported. In order to design circuits with guardbands that are safe for long-term and instantaneous effects, new aging models are required. We are presenting the first approach that in fact considers both long-term as well as instantaneous BTI effects. It can be employed for complex circuits at the micro-architecture level. Designing guardbands based upon our physical BTI model reduces the guardbands by 41% and thus allows for the development of more cost-effective yet reliable designs. We also revisit existing state-of-the-art aging mitigation techniques to investigate how they can be properly adapted to additionally account for instantaneous aging effects. Along with our BTI model this further reduces the guardbands by up to 59%.

References

[1]
J. Martin-Martinez, B. Kaczer, M. Toledano-Luque et al., "Probabilistic defect occupancy model for NBTI," in IRPS, 2011.
[2]
H. Reisinger, O. Blank, W. Heinrigs et al., "Analysis of nbti degradation- and recovery-behavior based on ultra fast vt-measurements," in IRPS, 2006.
[3]
K. Aadithya, A. Demir, and S. Venugopalan et. al., "Accurate Prediction of Random Telegraph Noise Effects in SRAMs and DRAMs," TCAD, 2013.
[4]
J. Henkel, T. Ebi, H. Amrouch et al., "Thermal management for dependable on-chip systems," in ASP-DAC, 2013.
[5]
B. Tudor, J. Wang, C. Sun et al., "MOSRA: An efficient and versatile MOS aging modeling and reliability analysis solution for 45nm and below," in ICSICT, 2010.
[6]
J. Chen, S. Wang, and M. Tehranipoor, "Critical-reliability Path Identification and Delay Analysis," J. Emerg. Technol. Comput. Syst., 2014.
[7]
H. Amrouch, J. Martin-Martinez, V. van Santen et al., "Connecting the physical and application level towards grasping aging effects," in IRPS, 2015.
[8]
H. Reisinger, U. Brunner, W. Heinrigs et al., "A Comparison of Fast Methods for Measuring NBTI Degradation," TDMR, 2007.
[9]
T. Grasser, B. Kaczer, H. Reisinger et al., "On the frequency dependence of the bias temperature instability," in IRPS, 2012.
[10]
S. Mahapatra, N. Goel, S. Desai et al., "A Comparative Study of Different Physics-Based NBTI Models," T-ED, 2013.
[11]
N. Binkert, B. Beckmann, G. Black et al., "The Gem5 Simulator," SIGARCH Comput. Archit. News, 2011.
[12]
S. Kumar, C. Kim, and S. Sapatnekar, "Impact of nbti on sram read stability and design for reliability," in ISQED, 2006.
[13]
H. Amrouch, V. van Santen, T. Ebi et al., "Towards interdependencies of aging mechanisms," in ICCAD, 2014.
[14]
S. Li, J. H. Ahn, R. D. Strong et al., "The McPAT Framework for Multicore and Manycore Architectures: Simultaneously Modeling Power, Area, and Timing," ACM Trans. Archit. Code Optim., 2013.
[15]
M. R. Stan, K. Skadron, M. Barcella et al., "Hotspot: a dynamic compact thermal model at the processorarchitecture level," Microelectronics Journal, 2003.
[16]
H. Amrouch, B. Khaleghi, A. Gerstlauer et al., "Reliability-Aware Design to Suppress Aging," in DAC, 2016.
[17]
E. Gunadi, A. A. Sinkar, N. S. Kim et al., "Combating Aging with the Colt Duty Cycle Equalizer," in MICRO, 2010.
[18]
J. Henkel, L. Bauer, J. Becker et al., "Design and architectures for dependable embedded systems," in CODES, 2011.

Cited By

View all
  • (2024)Exploring BTI Aging Effects on Spatial Power Density and Temperature Profiles of VLSI ChipsIntegration10.1016/j.vlsi.2024.102202(102202)Online publication date: Apr-2024
  • (2023)Modeling and Predicting Transistor Aging Under Workload Dependency Using Machine LearningIEEE Transactions on Circuits and Systems I: Regular Papers10.1109/TCSI.2023.328932570:9(3699-3711)Online publication date: Sep-2023
  • (2023)Long-Term Aging Impacts on Spatial On-Chip Power Density and Temperature2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)10.1109/SMACD58065.2023.10192234(1-4)Online publication date: 3-Jul-2023
  • Show More Cited By

Recommendations

Comments

Information & Contributors

Information

Published In

cover image ACM Other conferences
DAC '16: Proceedings of the 53rd Annual Design Automation Conference
June 2016
1048 pages
ISBN:9781450342360
DOI:10.1145/2897937
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

Publisher

Association for Computing Machinery

New York, NY, United States

Publication History

Published: 05 June 2016

Permissions

Request permissions for this article.

Check for updates

Qualifiers

  • Research-article

Conference

DAC '16

Acceptance Rates

Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

Contributors

Other Metrics

Bibliometrics & Citations

Bibliometrics

Article Metrics

  • Downloads (Last 12 months)10
  • Downloads (Last 6 weeks)3
Reflects downloads up to 04 Nov 2024

Other Metrics

Citations

Cited By

View all
  • (2024)Exploring BTI Aging Effects on Spatial Power Density and Temperature Profiles of VLSI ChipsIntegration10.1016/j.vlsi.2024.102202(102202)Online publication date: Apr-2024
  • (2023)Modeling and Predicting Transistor Aging Under Workload Dependency Using Machine LearningIEEE Transactions on Circuits and Systems I: Regular Papers10.1109/TCSI.2023.328932570:9(3699-3711)Online publication date: Sep-2023
  • (2023)Long-Term Aging Impacts on Spatial On-Chip Power Density and Temperature2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)10.1109/SMACD58065.2023.10192234(1-4)Online publication date: 3-Jul-2023
  • (2023)Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)10.1109/DFT59622.2023.10313528(1-6)Online publication date: 3-Oct-2023
  • (2022)Lifetime Reliability Optimization Algorithms of Integrated Circuits Using Dual-Threshold Voltage AssignmentLifetime Reliability-aware Design of Integrated Circuits10.1007/978-3-031-15345-7_6(85-105)Online publication date: 17-Nov-2022
  • (2020)Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power ProcessorsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2020.300347128:10(2122-2133)Online publication date: Oct-2020
  • (2019)Reliability Challenges with Self-Heating and Aging in FinFET Technology2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)10.1109/IOLTS.2019.8854405(68-71)Online publication date: Jul-2019
  • (2019)An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging EffectsJournal of Electronic Testing: Theory and Applications10.1007/s10836-019-05772-535:1(87-100)Online publication date: 1-Feb-2019
  • (2018)Fast Estimations of Failure Probability Over Long Time SpansProceedings of the 14th IEEE/ACM International Symposium on Nanoscale Architectures10.1145/3232195.3232198(1-6)Online publication date: 17-Jul-2018
  • (2018)AROMa: Aging-Aware Deadlock-Free Adaptive Routing Algorithm and Online Monitoring in 3D NoCsIEEE Transactions on Parallel and Distributed Systems10.1109/TPDS.2017.278017329:4(772-788)Online publication date: 1-Apr-2018
  • Show More Cited By

View Options

Get Access

Login options

View options

PDF

View or Download as a PDF file.

PDF

eReader

View online with eReader.

eReader

Media

Figures

Other

Tables

Share

Share

Share this Publication link

Share on social media