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Link to original content: https://doi.org/10.1007/s13198-023-02221-7
Modified chain group sampling inspection plan under item failure scenario based on time truncated scheme | International Journal of System Assurance Engineering and Management Skip to main content
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Modified chain group sampling inspection plan under item failure scenario based on time truncated scheme

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Abstract

A modified chain group sampling inspection plan (MChGSIP) is presented in this article where the lifetime of units follows a generalized half-normal distribution (GHND). In the present study, a brief discussion of the GHND is placed and larger the value of mean—better is the quality of the lot is considered as quality characteristic for the proposed plan. Here, we have used the two point approach: average quality level (AQL) and the limiting quality level (LQL) for the computation of plan parameters purpose. The AQL and the LQL is used to calculate all of the plan parameters in the presence of the two-point method. Aside from that, MChGSIP calculates operating characteristic values based on the values of plan parameters that are supplied. The tables that have been presented are discussed in depth. Three data sets are used to prove the significance of proposed plan in real life scenario and the only constraint of this study is that it ll helpful to the experimenter or researcher if and only if real life situation matched with behavior of GHND.

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Acknowledgements

The authors thanked the Associate Editor and the Reviewers for their very careful reading and constructive comments which helped us to improve the earlier version of this article.

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Authors and Affiliations

  1. Symbiosis Statistical Institute, Symbiosis International University (Deemed), Pune, India

    Harsh Tripathi

  2. Department of Statistics, University of Delhi, Delhi, India

    Mahendra Saha

  3. Department of Statistics, Central University of Rajasthan, Ajmer, India

    Mahendra Saha

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  1. Harsh Tripathi
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  2. Mahendra Saha
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Correspondence to Harsh Tripathi.

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Tripathi, H., Saha, M. Modified chain group sampling inspection plan under item failure scenario based on time truncated scheme. Int J Syst Assur Eng Manag 15, 1305–1314 (2024). https://doi.org/10.1007/s13198-023-02221-7

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