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Link to original content: https://dblp.uni-trier.de/rec/journals/tvlsi/SalaminSAPMH19.rdf
Sami Salamin et al.: Modeling the Interdependences Between Voltage Fluctuation and BTI Aging. (2019) journals/tvlsi/SalaminSAPMH19 10.1109/TVLSI.2019.2899890 Modeling the Interdependences Between Voltage Fluctuation and BTI Aging. 6 Sami Salamin 1 Victor M. van Santen 2 Hussam Amrouch 3 Narendra Parihar 4 Souvik Mahapatra 5 Jörg Henkel 6 1652-1665 IEEE Trans. Very Large Scale Integr. Syst. IEEE Trans. Very Large Scale Integr. Syst. 27 7 2019 provenance information for RDF data of dblp record 'journals/tvlsi/SalaminSAPMH19' 2020-03-11T18:18:50+0100