Sami Salamin et al.: Modeling the Interdependences Between Voltage Fluctuation and BTI Aging. (2019)journals/tvlsi/SalaminSAPMH1910.1109/TVLSI.2019.2899890Modeling the Interdependences Between Voltage Fluctuation and BTI Aging.6Sami Salamin1Victor M. van Santen2Hussam Amrouch3Narendra Parihar4Souvik Mahapatra5Jörg Henkel61652-1665IEEE Trans. Very Large Scale Integr. Syst.IEEE Trans. Very Large Scale Integr. Syst.2772019provenance information for RDF data of dblp record 'journals/tvlsi/SalaminSAPMH19'2020-03-11T18:18:50+0100