Jaechang NamWei Fu 0002Sunghun Kim 0001Tim MenziesLin Tan 0001Heterogeneous Defect Prediction.874-896201844IEEE Trans. Software Eng.9https://doi.org/10.1109/TSE.2017.2720603http://doi.ieeecomputersociety.org/10.1109/TSE.2017.2720603db/journals/tse/tse44.html#Nam00MT18