Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
Content:text/plain; charset="utf-8"
TY - JOUR
ID - DBLP:journals/tcasI/MohamedSASA24
AU - Mohamed, Tarek
AU - Santen, Victor M. van
AU - Alrahis, Lilas
AU - Sinanoglu, Ozgur
AU - Amrouch, Hussam
TI - Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability.
JO - IEEE Trans. Circuits Syst. I Regul. Pap.
VL - 71
IS - 7
SP - 3269
EP - 3281
PY - 2024/07/
DO - 10.1109/TCSI.2024.3397460
UR - https://doi.org/10.1109/TCSI.2024.3397460
ER -
