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https://dblp.uni-trier.de/rec/journals/tcasI/MohamedSASA24.nt
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"Tarek Mohamed et al.: Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability. (2024)" .
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_:ID_6348e003ae9199b6c5ccd85df35d32b7 . _:ID_6348e003ae9199b6c5ccd85df35d32b7
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"journals/tcasI/MohamedSASA24" .
_:ID_5bc434fa699a5d33dd7f91863fc3bf69 . _:ID_5bc434fa699a5d33dd7f91863fc3bf69
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"10.1109/TCSI.2024.3397460" .
"Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability." .
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"5"^^
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_:Sig_502afee0a32534fab2aef73ae7f0cdfb_1 . _:Sig_502afee0a32534fab2aef73ae7f0cdfb_1
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"Tarek Mohamed" . _:Sig_502afee0a32534fab2aef73ae7f0cdfb_1
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"1"^^
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_:Sig_502afee0a32534fab2aef73ae7f0cdfb_2 . _:Sig_502afee0a32534fab2aef73ae7f0cdfb_2
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"Victor M. van Santen" . _:Sig_502afee0a32534fab2aef73ae7f0cdfb_2
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"2"^^
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_:Sig_502afee0a32534fab2aef73ae7f0cdfb_3 . _:Sig_502afee0a32534fab2aef73ae7f0cdfb_3
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"Lilas Alrahis" . _:Sig_502afee0a32534fab2aef73ae7f0cdfb_3
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"3"^^
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_:Sig_502afee0a32534fab2aef73ae7f0cdfb_4 . _:Sig_502afee0a32534fab2aef73ae7f0cdfb_4
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"Ozgur Sinanoglu" . _:Sig_502afee0a32534fab2aef73ae7f0cdfb_4
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"4"^^
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_:Sig_502afee0a32534fab2aef73ae7f0cdfb_5 . _:Sig_502afee0a32534fab2aef73ae7f0cdfb_5
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"Hussam Amrouch" . _:Sig_502afee0a32534fab2aef73ae7f0cdfb_5
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"5"^^
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"3269-3281" .
"IEEE Trans. Circuits Syst. I Regul. Pap." .
"IEEE Trans. Circuits Syst. I Regul. Pap." .
"71" .
"7" .
"2024"^^
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"--07"^^
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"provenance information for RDF data of dblp record 'journals/tcasI/MohamedSASA24'" .
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"2024-07-19T23:17:19+0200" .