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Link to original content: https://dblp.uni-trier.de/rec/journals/tcas/SantenAH19a.xml
Victor M. van Santen Hussam Amrouch Jörg Henkel Modeling and Evaluating the Gate Length Dependence of BTI. 1527-1531 2019 66-II IEEE Trans. Circuits Syst. II Express Briefs 9 https://doi.org/10.1109/TCSII.2018.2885850 db/journals/tcas/tcasII66.html#SantenAH19a