Victor M. van SantenHussam AmrouchJörg HenkelModeling and Evaluating the Gate Length Dependence of BTI.1527-1531201966-IIIEEE Trans. Circuits Syst. II Express Briefs9https://doi.org/10.1109/TCSII.2018.2885850db/journals/tcas/tcasII66.html#SantenAH19a