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Link to original content: https://dblp.uni-trier.de/rec/journals/mr/SharmaTWRREPCG15.xml
Prateek Sharma Stanislav Tyaginov Yannick Wimmer Florian Rudolf Karl Rupp Hubert Enichlmair J. H. Park Hajdin Ceric Tibor Grasser Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs. 1427-1432 2015 55 Microelectron. Reliab. 9-10 https://doi.org/10.1016/j.microrel.2015.06.021 db/journals/mr/mr55.html#SharmaTWRREPCG15