Prateek SharmaStanislav TyaginovYannick WimmerFlorian RudolfKarl RuppHubert EnichlmairJ. H. ParkHajdin CericTibor GrasserComparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs.1427-1432201555Microelectron. Reliab.9-10https://doi.org/10.1016/j.microrel.2015.06.021db/journals/mr/mr55.html#SharmaTWRREPCG15