Paul MarkoMatteo MeneghiniSergey BychikhinDenis MarconGaudenzio MeneghessoEnrico ZanoniDionyz PoganyIV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors.2194-2199201252Microelectron. Reliab.9-10https://doi.org/10.1016/j.microrel.2012.06.030db/journals/mr/mr52.html#MarkoMBMMZP12