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Link to original content: https://dblp.uni-trier.de/rec/journals/mr/MarkoMBMMZP12.xml
Paul Marko Matteo Meneghini Sergey Bychikhin Denis Marcon Gaudenzio Meneghesso Enrico Zanoni Dionyz Pogany IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors. 2194-2199 2012 52 Microelectron. Reliab. 9-10 https://doi.org/10.1016/j.microrel.2012.06.030 db/journals/mr/mr52.html#MarkoMBMMZP12