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Link to original content: https://dblp.uni-trier.de/rec/journals/mr/BlahoPGDGS03.xml
M. Blaho Dionyz Pogany Erich Gornik Marie Denison Gerhard Groos Matthias Stecher Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. 545-548 2003 43 Microelectron. Reliab. 4 https://doi.org/10.1016/S0026-2714(03)00021-0 https://www.wikidata.org/entity/Q110626976 db/journals/mr/mr43.html#BlahoPGDGS03