M. BlahoDionyz PoganyErich GornikMarie DenisonGerhard GroosMatthias StecherStudy of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method.545-548200343Microelectron. Reliab.4https://doi.org/10.1016/S0026-2714(03)00021-0https://www.wikidata.org/entity/Q110626976db/journals/mr/mr43.html#BlahoPGDGS03