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Link to original content: https://dblp.uni-trier.de/rec/journals/iet-cds/SalemZMS18.rdf
Sanaz Salem et al.: Fault-tolerant delay cell for ring oscillator application in 65 nm CMOS technology. (2018) journals/iet-cds/SalemZMS18 10.1049/IET-CDS.2017.0380 Fault-tolerant delay cell for ring oscillator application in 65 nm CMOS technology. 4 Sanaz Salem 1 Hamed Zandevakili 2 Ali Mahani 0001 3 Mohsen Saneei 4 233-241 IET Circuits Devices Syst. IET Circuits Devices Syst. 12 3 2018 provenance information for RDF data of dblp record 'journals/iet-cds/SalemZMS18' 2022-10-02T15:36:39+0200