Felipe Restrepo-CalleSergio Cuenca-AsensiAntonio Martínez-ÁlvarezEduardo ChielleFernanda Lima KastensmidtApplication-Based Analysis of Register File Criticality for Reliability Assessment in Embedded Microprocessors.139-150201531J. Electron. Test.2https://doi.org/10.1007/s10836-015-5513-9db/journals/et/et31.html#Restrepo-CalleC15