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https://dblp.uni-trier.de/rec/journals/eswa/KangLCKPPD09.nt
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"Pilsung Kang et al.: A virtual metrology system for semiconductor manufacturing. (2009)" .
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_:ID_9080cf362e7091ada7cc28518e4adb2e . _:ID_9080cf362e7091ada7cc28518e4adb2e
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"journals/eswa/KangLCKPPD09" .
_:ID_9384ff40bdcc83aa4e082a2deca3e422 . _:ID_9384ff40bdcc83aa4e082a2deca3e422
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"10.1016/J.ESWA.2009.05.053" .
"A virtual metrology system for semiconductor manufacturing." .
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"7"^^
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_:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_1 . _:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_1
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"Pilsung Kang 0001" . _:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_1
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"1"^^
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_:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_2 . _:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_2
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"Hyoungjoo Lee" . _:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_2
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"2"^^
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_:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_3 . _:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_3
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"Sungzoon Cho" . _:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_3
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"3"^^
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_:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_4 . _:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_4
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"Dongil Kim" . _:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_4
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"4"^^
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_:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_5 . _:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_5
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"Jinwoo Park" . _:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_5
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"5"^^
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_:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_6 . _:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_6
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"Chan-Kyoo Park" . _:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_6
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"6"^^
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_:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_7 . _:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_7
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"Seungyong Doh" . _:Sig_2cbfe2603eb68ef1440b3b7b9e90d872_7
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"7"^^
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"12554-12561" .
"Expert Syst. Appl." .
"Expert Syst. Appl." .
"36" .
"10" .
"2009"^^
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"provenance information for RDF data of dblp record 'journals/eswa/KangLCKPPD09'" .
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"2023-03-21T21:04:32+0100" .