Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
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TY - CPAPER
ID - DBLP:conf/vts/SantenTCHA21
AU - Santen, Victor M. van
AU - Thomann, Simon
AU - Chauchan, Yogesh S.
AU - Henkel, Jörg
AU - Amrouch, Hussam
TI - Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks.
BT - 39th IEEE VLSI Test Symposium, VTS 2021, San Diego, CA, USA, April 25-28, 2021
SP - 1
EP - 7
PY - 2021//
DO - 10.1109/VTS50974.2021.9441053
UR - https://doi.org/10.1109/VTS50974.2021.9441053
ER -
