BibTeX record conf/vts/AmrouchCJKKKPST21

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@inproceedings{DBLP:conf/vts/AmrouchCJKKKPST21,
  author       = {Hussam Amrouch and
                  Animesh Basak Chowdhury and
                  Wentian Jin and
                  Ramesh Karri and
                  Farshad Khorrami and
                  Prashanth Krishnamurthy and
                  Ilia Polian and
                  Victor M. van Santen and
                  Benjamin Tan and
                  Sheldon X.{-}D. Tan},
  title        = {Special Session: Machine Learning for Semiconductor Test and Reliability},
  booktitle    = {39th {IEEE} {VLSI} Test Symposium, {VTS} 2021, San Diego, CA, USA,
                  April 25-28, 2021},
  pages        = {1--11},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/VTS50974.2021.9441052},
  doi          = {10.1109/VTS50974.2021.9441052},
  timestamp    = {Sun, 12 Nov 2023 02:16:34 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/AmrouchCJKKKPST21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}