Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
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TY - CPAPER
ID - DBLP:conf/vlsid/ShuklaRW18
AU - Shukla, Ankur
AU - Rao, Rahul M.
AU - Warnock, James D.
TI - Impact of Device Aging on Early Mode Failures in Pulsed Latches.
BT - 31st International Conference on VLSI Design and 17th International Conference on Embedded Systems, VLSID 2018, Pune, India, January 6-10, 2018
SP - 256
EP - 260
PY - 2018//
DO - 10.1109/VLSID.2018.72
UR - https://doi.org/10.1109/VLSID.2018.72
UR - https://doi.ieeecomputersociety.org/10.1109/VLSID.2018.72
ER -
