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Link to original content: https://dblp.uni-trier.de/rec/conf/vlsi-dat/SantenSA21.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - CPAPER ID - DBLP:conf/vlsi-dat/SantenSA21 AU - Santen, Victor M. van AU - Schillinger, Linda AU - Amrouch, Hussam TI - Self-Heating Effects from Transistors to Gates. BT - International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021, Hsinchu, Taiwan, April 19-22, 2021 SP - 1 EP - 4 PY - 2021// DO - 10.1109/VLSI-DAT52063.2021.9427356 UR - https://doi.org/10.1109/VLSI-DAT52063.2021.9427356 ER -