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Link to original content: https://dblp.uni-trier.de/rec/conf/ssbse/EljuseW18.rdf
Basil Eljuse and Neil Walkinshaw: Comparison of Search-Based Algorithms for Stress-Testing Integrated Circuits. (2018) conf/ssbse/EljuseW18 10.1007/978-3-319-99241-9_10 Comparison of Search-Based Algorithms for Stress-Testing Integrated Circuits. 2 Basil Eljuse 1 Neil Walkinshaw 2 198-212 SSBSE SSBSE 2018 2018 provenance information for RDF data of dblp record 'conf/ssbse/EljuseW18' 2023-06-26T20:45:21+0200