Basil Eljuse and Neil Walkinshaw: Comparison of Search-Based Algorithms for Stress-Testing Integrated Circuits. (2018)conf/ssbse/EljuseW1810.1007/978-3-319-99241-9_10Comparison of Search-Based Algorithms for Stress-Testing Integrated Circuits.2Basil Eljuse1Neil Walkinshaw2198-212SSBSESSBSE20182018provenance information for RDF data of dblp record 'conf/ssbse/EljuseW18'2023-06-26T20:45:21+0200