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Link to original content: https://dblp.uni-trier.de/rec/conf/latw/ShinTST15.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - CPAPER ID - DBLP:conf/latw/ShinTST15 AU - Shin, Hosoon AU - Tan, Sheldon X.-D. AU - Shi, Guoyong AU - Tlelo-Cuautle, Esteban TI - Rare event diagnosis by iterative failure region locating and elite learning sample selection. BT - 16th Latin-American Test Symposium, LATS 2015, Puerto Vallarta, Mexico, March 25-27, 2015 SP - 1 EP - 5 PY - 2015// DO - 10.1109/LATW.2015.7102505 UR - https://doi.org/10.1109/LATW.2015.7102505 UR - https://doi.ieeecomputersociety.org/10.1109/LATW.2015.7102505 ER -