Thomas P. WarwickGustavo RiveraDavid WaiteJames RussellJeffrey SmithMeasurement Repeatability for RF Test Within the Load-board Constraints of High Density and Fine Pitch SOC Applications.1-102008ITChttps://doi.org/10.1109/TEST.2008.4700570https://doi.ieeecomputersociety.org/10.1109/TEST.2008.4700570conf/itc/2008db/conf/itc/itc2008.html#WarwickRWRS08