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Link to original content: https://dblp.uni-trier.de/rec/conf/islped/ZhangWB04.xml
Songqing Zhang Vineet Wason Kaustav Banerjee A probabilistic framework to estimate full-chips subthreshold leakage power distribution considering within-die and die-to-die P-T-V variations. 156-161 2004 conf/islped/2004 ISLPED https://doi.org/10.1145/1013235.1013278 db/conf/islped/islped2004.html#ZhangWB04