Songqing ZhangVineet WasonKaustav BanerjeeA probabilistic framework to estimate full-chips subthreshold leakage power distribution considering within-die and die-to-die P-T-V variations.156-1612004conf/islped/2004ISLPEDhttps://doi.org/10.1145/1013235.1013278db/conf/islped/islped2004.html#ZhangWB04