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Link to original content: https://dblp.uni-trier.de/rec/conf/irps/SantenTPGGSHMA20.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - CPAPER ID - DBLP:conf/irps/SantenTPGGSHMA20 AU - Santen, Victor M. van AU - Thomann, Simon AU - Pasupuleti, Chaitanya AU - Genssler, Paul R. AU - Gangwar, Narendra AU - Sharma, Uma AU - Henkel, Jörg AU - Mahapatra, Souvik AU - Amrouch, Hussam TI - BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity. BT - 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020 SP - 1 EP - 7 PY - 2020// DO - 10.1109/IRPS45951.2020.9128342 UR - https://doi.org/10.1109/IRPS45951.2020.9128342 ER -