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Link to original content: https://dblp.uni-trier.de/rec/conf/irps/HsiangLLLLLCLTW22.html?view=bibtex
dblp: BibTeX record conf/irps/HsiangLLLLLCLTW22

BibTeX record conf/irps/HsiangLLLLLCLTW22

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@inproceedings{DBLP:conf/irps/HsiangLLLLLCLTW22,
  author       = {K.{-}Y. Hsiang and
                  C.{-}Y. Liao and
                  Y.{-}Y. Lin and
                  Z.{-}F. Lou and
                  C.{-}Y. Lin and
                  J.{-}Y. Lee and
                  F.{-}S. Chang and
                  Z.{-}X. Li and
                  H.{-}C. Tseng and
                  C.{-}C. Wang and
                  W.{-}C. Ray and
                  T.{-}H. Hou and
                  T.{-}C. Chen and
                  C.{-}S. Chang and
                  Min{-}Hung Lee},
  title        = {Correlation between Access Polarization and High Endurance ({\textasciitilde}
                  10\({}^{\mbox{12}}\) cycling) of Ferroelectric and Anti-Ferroelectric
                  HfZrO2},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {9--1},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764533},
  doi          = {10.1109/IRPS48227.2022.9764533},
  timestamp    = {Sat, 30 Sep 2023 09:49:38 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/HsiangLLLLLCLTW22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}