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Link to original content: https://dblp.uni-trier.de/rec/conf/icicdt/FrancoAMVRWCLHC21.xml
Jacopo Franco Hiroaki Arimura J.-F. de Marneffe A. Vandooren L.-Å. Ragnarsson Zhicheng Wu Dieter Claes E. Dentoni Litta N. Horiguchi Kris Croes Dimitri Linten Tibor Grasser Ben Kaczer Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies : Invited paper. 1-4 2021 ICICDT https://doi.org/10.1109/ICICDT51558.2021.9626482 conf/icicdt/2021 db/conf/icicdt/icicdt2021.html#FrancoAMVRWCLHC21