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dblp: Stefano de Filippis https://dblp.org/pid/94/10632.html dblp person page RSS feed Mon, 07 Oct 2024 22:08:30 +0200 en-US daily 1 released under the CC0 1.0 license dblp@dagstuhl.de (dblp team) dblp@dagstuhl.de (dblp team) Computers/Computer_Science/Publications/Bibliographies http://www.rssboard.org/rss-specification https://dblp.org/img/logo.144x51.pngdblp: Stefano de Filippishttps://dblp.org/pid/94/10632.html14451 FEM simulation approach to investigate electro-thermal behavior of power transistors in 3-D.https://doi.org/10.1016/j.microrel.2012.09.002, , , , :
FEM simulation approach to investigate electro-thermal behavior of power transistors in 3-D. Microelectron. Reliab. 53(3): 356-362 ()]]>https://dblp.org/rec/journals/mr/KoselFCDI13Tue, 01 Jan 2013 00:00:00 +0100 Modeling of highly anisotropic microstructures for electro-thermal simulations of power semiconductor devices.https://doi.org/10.1016/j.microrel.2012.06.103, , , , , , :
Modeling of highly anisotropic microstructures for electro-thermal simulations of power semiconductor devices. Microelectron. Reliab. 52(9-10): 2374-2379 ()]]>https://dblp.org/rec/journals/mr/FilippisKNKDGI12Sun, 01 Jan 2012 00:00:00 +0100 Improved thermal management of low voltage power devices with optimized bond wire positions.https://doi.org/10.1016/j.microrel.2011.06.052, , , , , , , :
Improved thermal management of low voltage power devices with optimized bond wire positions. Microelectron. Reliab. 51(9-11): 1913-1918 ()]]>https://dblp.org/rec/journals/mr/KockDFINLGP11Sat, 01 Jan 2011 00:00:00 +0100 ANSYS based 3D electro-thermal simulations for the evaluation of power MOSFETs robustness.https://doi.org/10.1016/j.microrel.2011.06.047, , , , , :
ANSYS based 3D electro-thermal simulations for the evaluation of power MOSFETs robustness. Microelectron. Reliab. 51(9-11): 1954-1958 ()]]>https://dblp.org/rec/journals/mr/FilippisKDDKI11Sat, 01 Jan 2011 00:00:00 +0100