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2020 – today
- 2024
[j16]Raphael Viera, Jean-Max Dutertre, Rodrigo Silva Lima, Matthieu Pommies, Anthony Bertrand:
Tampering with the flash memory of microcontrollers: permanent fault injection via laser illumination during read operations. J. Cryptogr. Eng. 14(2): 207-221 (2024)- [j15]Mohammad Ebrahimabadi
, Suhee Sanjana Mehjabin, Raphael Viera, Sylvain Guilley, Jean-Luc Danger, Jean-Max Dutertre, Naghmeh Karimi:
DELFINES: Detecting Laser Fault Injection Attacks via Digital Sensors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(3): 774-787 (2024) - [j14]Paul Grandamme, Pierre-Antoine Tissot, Lilian Bossuet, Jean-Max Dutertre, Brice Colombier, Vincent Grosso:
Switching Off your Device Does Not Protect Against Fault Attacks. IACR Trans. Cryptogr. Hardw. Embed. Syst. 2024(4): 425-450 (2024) - [c75]Roukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage:
EM Fault Injection-Induced Clock Glitches: From Mechanism Analysis to Novel Sensor Design. IOLTS 2024: 1-7 - [i12]Paul Grandamme, Pierre-Antoine Tissot, Lilian Bossuet, Jean-Max Dutertre, Brice Colombier, Vincent Grosso:
Switching Off your Device Does Not Protect Against Fault Attacks. IACR Cryptol. ePrint Arch. 2024: 1123 (2024) - 2023
- [j13]Clément Gaine, Jean-Pierre Nikolovski, Driss Aboulkassimi, Jean-Max Dutertre:
Active Shielding Against Physical Attacks by Observation and Fault Injection: ChaXa. J. Hardw. Syst. Secur. 7(1): 1-10 (2023) - [j12]Anthony Zgheib, Olivier Potin, Jean-Baptiste Rigaud, Jean-Max Dutertre:
Experimental EMFI detection on a RISC-V core using the Trace Verifier solution. Microprocess. Microsystems 103: 104968 (2023) - [c74]Anthony Zgheib, Olivier Potin, Jean-Baptiste Rigaud, Jean-Max Dutertre:
A CCFI Verification Scheme Based on the RISC-V Trace Encoder. COSADE 2023: 42-61 - [c73]Roukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage:
Highlighting Two EM Fault Models While Analyzing a Digital Sensor Limitations. DATE 2023: 1-2 - [c72]Nathan Roussel, Olivier Potin, Jean-Max Dutertre, Jean-Baptiste Rigaud:
Security Evaluation of a Hybrid CMOS/MRAM Ascon Hardware Implementation. DATE 2023: 1-6 - [c71]François Bonnal, Vincent Dupaquis, Olivier Potin, Jean-Max Dutertre:
Software-Only Control-Flow Integrity Against Fault Injection Attacks. DSD 2023: 269-277 - [c70]Clément Gaine, Pierre-Alain Moëllic, Olivier Potin, Jean-Max Dutertre:
Fault Injection on Embedded Neural Networks: Impact of a Single Instruction Skip. DSD 2023: 317-324 - [c69]Kevin Hector, Pierre-Alain Moëllic, Jean-Max Dutertre, Mathieu Dumont:
Fault Injection and Safe-Error Attack for Extraction of Embedded Neural Network Models. ESORICS Workshops (2) 2023: 644-664 - [c68]Roukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage:
A Tale of Two Models: Discussing the Timing and Sampling EM Fault Injection Models. FDTC 2023: 1-12 - [c67]Théophile Gousselot, Olivier Thomas, Jean-Max Dutertre, Olivier Potin, Jean-Baptiste Rigaud:
Lightweight Countermeasures Against Original Linear Code Extraction Attacks on a RISC-V Core. HOST 2023: 89-99 - [c66]Anthony Zgheib, Olivier Potin, Jean-Baptiste Rigaud, Jean-Max Dutertre:
CIFER: Code Integrity and control Flow verification for programs Executed on a RISC-V core. HOST 2023: 100-110 - [c65]Mathieu Dumont, Kevin Hector, Pierre-Alain Moëllic, Jean-Max Dutertre, Simon Pontié:
Evaluation of Parameter-Based Attacks Against Embedded Neural Networks with Laser Injection. SAFECOMP 2023: 259-272 - [i11]Mathieu Dumont, Kevin Hector, Pierre-Alain Moëllic, Jean-Max Dutertre, Simon Pontié:
Evaluation of Parameter-based Attacks against Embedded Neural Networks with Laser Injection. CoRR abs/2304.12876 (2023) - [i10]Clément Gaine, Pierre-Alain Moëllic, Olivier Potin, Jean-Max Dutertre:
Fault Injection on Embedded Neural Networks: Impact of a Single Instruction Skip. CoRR abs/2308.16665 (2023) - [i9]Kevin Hector, Pierre-Alain Moëllic, Mathieu Dumont, Jean-Max Dutertre:
Fault Injection and Safe-Error Attack for Extraction of Embedded Neural Network Models. CoRR abs/2308.16703 (2023) - 2022
- [j11]Jean-Max Dutertre, Amir-Pasha Mirbaha, David Naccache, Assia Tria:
Photonic power firewalls. J. Cryptogr. Eng. 12(3): 245-254 (2022) - [c64]Raphael Viera, Jean-Max Dutertre, Rodrigo Silva Lima:
Injecting Permanent Faults into the Flash Memory of a Microcontroller with Laser Illumination During Read Operations. ASHES@CCS 2022: 75-84 - [c63]Anthony Zgheib, Olivier Potin, Jean-Baptiste Rigaud, Jean-Max Dutertre:
A CFI Verification System based on the RISC-V Instruction Trace Encoder. DSD 2022: 456-463 - [c62]Mohammad Ebrahimabadi, Suhee Sanjana Mehjabin, Raphael Viera, Sylvain Guilley, Jean-Luc Danger, Jean-Max Dutertre, Naghmeh Karimi:
Detecting Laser Fault Injection Attacks via Time-to-Digital Converter Sensors. HOST 2022: 97-100 - [c61]Nathan Roussel, Olivier Potin, Gregory di Pendina, Jean-Max Dutertre, Jean-Baptiste Rigaud:
CMOS/STT-MRAM Based Ascon LWC: a Power Efficient Hardware Implementation. ICECS 2022 2022: 1-4 - [c60]William Souza da Cruz, Raphael Viera, Jean-Baptiste Rigaud, Guillaume Hubert, Jean-Max Dutertre:
An Experimentally Tuned Compact Electrical Model for Laser Fault Injection Simulation. IOLTS 2022: 1-5 - [c59]Kevin Hector, Pierre-Alain Moëllic, Mathieu Dumont, Jean-Max Dutertre:
A Closer Look at Evaluating the Bit-Flip Attack Against Deep Neural Networks. IOLTS 2022: 1-5 - [i8]Kevin Hector, Mathieu Dumont, Pierre-Alain Moëllic, Jean-Max Dutertre:
A Closer Look at Evaluating the Bit-Flip Attack Against Deep Neural Networks. CoRR abs/2209.14243 (2022) - 2021
- [c58]William Souza da Cruz, Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Jean-Baptiste Rigaud, Guillaume Hubert:
Further Analysis of Laser-induced IR-drop. ATS 2021: 91-96 - [c57]Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi:
SideLine: How Delay-Lines (May) Leak Secrets from Your SoC. COSADE 2021: 3-30 - [c56]Vanthanh Khuat, Jean-Max Dutertre, Jean-Luc Danger:
Analysis of a Laser-induced Instructions Replay Fault Model in a 32-bit Microcontroller. DSD 2021: 363-370 - [c55]Vanthanh Khuat, Jean-Luc Danger, Jean-Max Dutertre:
Laser Fault Injection in a 32-bit Microcontroller: from the Flash Interface to the Execution Pipeline. FDTC 2021: 74-85 - [c54]Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi:
FaultLine: Software-Based Fault Injection on Memory Transfers. HOST 2021: 46-55 - [c53]Rémi Bernhard, Pierre-Alain Moëllic, Jean-Max Dutertre:
Luring Transferable Adversarial Perturbations for Deep Neural Networks. IJCNN 2021: 1-8 - [c52]Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Mathieu Dumont, Pierre-Alain Moëllic:
Permanent Laser Fault Injection into the Flash Memory of a Microcontroller. NEWCAS 2021: 1-4 - [c51]Mathieu Dumont, Pierre-Alain Moëllic, Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Rémi Bernhard:
An Overview of Laser Injection against Embedded Neural Network Models. WF-IoT 2021: 616-621 - [i7]Mathieu Dumont, Pierre-Alain Moëllic, Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Rémi Bernhard:
An Overview of Laser Injection against Embedded Neural Network Models. CoRR abs/2105.01403 (2021) - 2020
- [j10]Raphael Andreoni Camponogara Viera, Philippe Maurine, Jean-Max Dutertre, Rodrigo Possamai Bastos:
Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault Injection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(6): 1231-1244 (2020) - [c50]Alexandre Menu, Jean-Max Dutertre, Olivier Potin, Jean-Baptiste Rigaud, Jean-Luc Danger:
Experimental Analysis of the Electromagnetic Instruction Skip Fault Model. DTIS 2020: 1-7 - [c49]Alexandre Menu, Jean-Max Dutertre, Jean-Baptiste Rigaud, Brice Colombier, Pierre-Alain Moëllic, Jean-Luc Danger:
Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation. FDTC 2020: 41-48 - [c48]William Souza da Cruz, Jean-Max Dutertre, Jean-Baptiste Rigaud, Guillaume Hubert:
Evidence of a Dynamic Fault Model in the DICE Radiation-Hardened Cell. SBCCI 2020: 1-6 - [c47]Clément Gaine, Driss Aboulkassimi, Simon Pontié, Jean-Pierre Nikolovski, Jean-Max Dutertre:
Electromagnetic Fault Injection as a New Forensic Approach for SoCs. WIFS 2020: 1-6 - [i6]Rémi Bernhard, Pierre-Alain Moëllic, Jean-Max Dutertre:
Luring of Adversarial Perturbations. CoRR abs/2004.04919 (2020) - [i5]Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi:
SideLine: How Delay-Lines (May) Leak Secrets from your SoC. CoRR abs/2009.07773 (2020) - [i4]Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi:
SideLine: How Delay-Lines (May) Leak Secrets from your SoC. IACR Cryptol. ePrint Arch. 2020: 1127 (2020)
2010 – 2019
- 2019
- [c46]Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi, Francis Olivier:
Remote Side-Channel Attacks on Heterogeneous SoC. CARDIS 2019: 109-125 - [c45]Rémi Bernhard, Pierre-Alain Moëllic, Jean-Max Dutertre:
Impact of Low-Bitwidth Quantization on the Adversarial Robustness for Embedded Neural Networks. CW 2019: 308-315 - [c44]Alexandre Menu, Shivam Bhasin, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger:
Precise Spatio-Temporal Electromagnetic Fault Injections on Data Transfers. FDTC 2019: 1-8 - [c43]Brice Colombier, Alexandre Menu, Jean-Max Dutertre, Pierre-Alain Moëllic, Jean-Baptiste Rigaud, Jean-Luc Danger:
Laser-induced Single-bit Faults in Flash Memory: Instructions Corruption on a 32-bit Microcontroller. HOST 2019: 1-10 - [c42]Mounia Kharbouche-Harrari, Romain Wacquez, Gregory di Pendina, Jean-Max Dutertre, Jérémy Postel-Pellerin, Driss Aboulkassimi, Jean-Michel Portal:
Dual Detection of Heating and Photocurrent attacks (DDHP) Sensor using Hybrid CMOS/STT-MRAM. IOLTS 2019: 322-327 - [c41]Jean-Max Dutertre, Timothée Riom, Olivier Potin, Jean-Baptiste Rigaud:
Experimental Analysis of the Laser-Induced Instruction Skip Fault Model. NordSec 2019: 221-237 - [c40]Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi:
High-Speed Ring Oscillator based Sensors for Remote Side-Channel Attacks on FPGAs. ReConFig 2019: 1-8 - [i3]Rémi Bernhard, Pierre-Alain Moëllic, Jean-Max Dutertre:
Impact of Low-bitwidth Quantization on the Adversarial Robustness for Embedded Neural Networks. CoRR abs/1909.12741 (2019) - 2018
- [j9]Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Marie-Lise Flottes, Olivier Potin, Giorgio Di Natale, Bruno Rouzeyre, Rodrigo Possamai Bastos:
Assessing body built-in current sensors for detection of multiple transient faults. Microelectron. Reliab. 88-90: 128-134 (2018) - [c39]Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Stephan De Castro, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre:
Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model. FDTC 2018: 1-6 - [c38]Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre:
The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks. IOLTS 2018: 214-219 - [c37]Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Philippe Maurine, Rodrigo Possamai Bastos:
Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits. ISPD 2018: 160-167 - [i2]Brice Colombier, Alexandre Menu, Jean-Max Dutertre, Pierre-Alain Moëllic, Jean-Baptiste Rigaud, Jean-Luc Danger:
Laser-induced Single-bit Faults in Flash Memory: Instructions Corruption on a 32-bit Microcontroller. IACR Cryptol. ePrint Arch. 2018: 1042 (2018) - 2017
- [j8]Raphael Andreoni Camponogara Viera, Rodrigo Possamai Bastos, Jean-Max Dutertre, Philippe Maurine, Rodrigo Iga Jadue:
Method for evaluation of transient-fault detection techniques. Microelectron. Reliab. 76-77: 68-74 (2017) - [c36]Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Rodrigo Possamai Bastos, Philippe Maurine:
Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation. DSD 2017: 252-259 - [c35]Raphael Andreoni Camponogara Viera, Philippe Maurine, Jean-Max Dutertre, Rodrigo Possamai Bastos:
Importance of IR drops on the modeling of laser-induced transient faults. SMACD 2017: 1-4 - 2016
- [j7]Stephan De Castro, Jean-Max Dutertre, Bruno Rouzeyre, Giorgio Di Natale, Marie-Lise Flottes:
Frontside Versus Backside Laser Injection: A Comparative Study. ACM J. Emerg. Technol. Comput. Syst. 13(1): 6:1-6:15 (2016) - [c34]Jean-Max Dutertre, Amir-Pasha Mirbaha, David Naccache, Assia Tria:
Photonic Power Firewalls. The New Codebreakers 2016: 342-354 - [c33]Marc Lacruche, Noemie Beringuier-Boher, Jean-Max Dutertre, Jean-Baptiste Rigaud, Edith Kussener:
On the use of Forward Body Biasing to decrease the repeatability of laser-induced faults. DATE 2016: 547-550 - [c32]Noemie Beringuier-Boher, Marc Lacruche, David El-Baze, Jean-Max Dutertre, Jean-Baptiste Rigaud, Philippe Maurine:
Body Biasing Injection Attacks in Practice. CS2@HiPEAC 2016: 49-54 - 2015
- [j6]Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Jean-Max Dutertre, Alexandre Sarafianos:
Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation. Microelectron. Reliab. 55(9-10): 1592-1599 (2015) - [c31]Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Alexandre Sarafianos, Jean-Max Dutertre:
Influence of triple-well technology on laser fault injection and laser sensor efficiency. DFTS 2015: 85-90 - [c30]Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos:
SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology. DFTS 2015: 177-182 - [c29]Loïc Zussa, Ingrid Exurville, Jean-Max Dutertre, Jean-Baptiste Rigaud, Bruno Robisson, Assia Tria, Jessy Clédière:
Evidence of an information leakage between logically independent blocks. CS2@HiPEAC 2015: 25-30 - [c28]Marc Lacruche, Nicolas Borrel, Clement Champeix, Cyril Roscian, Alexandre Sarafianos, Jean-Baptiste Rigaud, Jean-Max Dutertre, Edith Kussener:
Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses. IOLTS 2015: 13-18 - [c27]Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos:
Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents. IOLTS 2015: 150-155 - [c26]Nicolas Borrel, Clement Champeix, Mathieu Lisart, Alexandre Sarafianos, Edith Kussener, Wenceslas Rahajandraibe, Jean-Max Dutertre:
Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation. IRPS 2015: 1 - [c25]Stephan De Castro, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Jean-Max Dutertre:
Figure of Merits of 28nm Si Technologies for Implementing Laser Attack Resistant Security Dedicated Circuits. ISVLSI 2015: 362-367 - 2014
- [j5]Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale, Alexandre Sarafianos:
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS. Microelectron. Reliab. 54(9-10): 2289-2294 (2014) - [c24]Sébastien Ordas, Ludovic Guillaume-Sage, Karim Tobich, Jean-Max Dutertre, Philippe Maurine:
Evidence of a Larger EM-Induced Fault Model. CARDIS 2014: 245-259 - [c23]Loïc Zussa, Amine Dehbaoui, Karim Tobich, Jean-Max Dutertre, Philippe Maurine, Ludovic Guillaume-Sage, Jessy Clédière, Assia Tria:
Efficiency of a glitch detector against electromagnetic fault injection. DATE 2014: 1-6 - [c22]Jean-Max Dutertre, Stephan De Castro, Alexandre Sarafianos, Noemie Boher, Bruno Rouzeyre, Mathieu Lisart, Joel Damiens, Philippe Candelier, Marie-Lise Flottes, Giorgio Di Natale:
Laser attacks on integrated circuits: From CMOS to FD-SOI. DTIS 2014: 1-6 - [c21]Loïc Zussa, Jean-Max Dutertre, Jessy Clédière, Bruno Robisson:
Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter. HOST 2014: 130-135 - [c20]Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier:
Laser-induced fault effects in security-dedicated circuits. VLSI-SoC 2014: 1-6 - [c19]Paolo Maistri, Régis Leveugle, Lilian Bossuet, Alain Aubert, Viktor Fischer, Bruno Robisson, Nicolas Moro, Philippe Maurine, Jean-Max Dutertre, Mathieu Lisart:
Electromagnetic analysis and fault injection onto secure circuits. VLSI-SoC 2014: 1-6 - [c18]Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, Marie-Lise Flottes, David Hély, Guillaume Hubert, Régis Leveugle, Feng Lu, Paolo Maistri, Athanasios Papadimitriou, Bruno Rouzeyre, Clément Tavernier, Pierre Vanhauwaert:
Laser-Induced Fault Effects in Security-Dedicated Circuits. VLSI-SoC (Selected Papers) 2014: 220-240 - 2013
- [j4]Alexandre Sarafianos, Cyril Roscian, Jean-Max Dutertre, Mathieu Lisart, Assia Tria:
Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell. Microelectron. Reliab. 53(9-11): 1300-1305 (2013) - [j3]Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale:
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection. Microelectron. Reliab. 53(9-11): 1320-1324 (2013) - [c17]Amine Dehbaoui, Amir-Pasha Mirbaha, Nicolas Moro, Jean-Max Dutertre, Assia Tria:
Electromagnetic Glitch on the AES Round Counter. COSADE 2013: 17-31 - [c16]Alexandre Sarafianos, Mathieu Lisart, Olivier Gagliano, Valerie Serradeil, Cyril Roscian, Jean-Max Dutertre, Assia Tria:
Robustness improvement of an SRAM cell against laser-induced fault injection. DFTS 2013: 149-154 - [c15]Amir-Pasha Mirbaha, Jean-Max Dutertre, Assia Tria:
Differential analysis of Round-Reduced AES faulty ciphertexts. DFTS 2013: 204-211 - [c14]Cyril Roscian, Alexandre Sarafianos, Jean-Max Dutertre, Assia Tria:
Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells. FDTC 2013: 89-98 - [c13]Rodrigo Possamai Bastos, Frank Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
A bulk built-in sensor for detection of fault attacks. HOST 2013: 51-54 - [c12]Cyril Roscian, Jean-Max Dutertre, Assia Tria:
Frontside laser fault injection on cryptosystems - Application to the AES' last round -. HOST 2013: 119-124 - [c11]Loïc Zussa, Jean-Max Dutertre, Jessy Clédière, Assia Tria:
Power supply glitch induced faults on FPGA: An in-depth analysis of the injection mechanism. IOLTS 2013: 110-115 - [c10]Rodrigo Possamai Bastos, Frank Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults. PATMOS 2013: 157-163 - [c9]Ingrid Exurville, Jacques J. A. Fournier, Jean-Max Dutertre, Bruno Robisson, Assia Tria:
Practical measurements of data path delays for IP authentication & integrity verification. ReCoSoC 2013: 1-6 - 2012
- [j2]Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis:
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology. Microelectron. Reliab. 52(9-10): 2035-2038 (2012) - [c8]Amine Dehbaoui, Jean-Max Dutertre, Bruno Robisson, Assia Tria:
Electromagnetic Transient Faults Injection on a Hardware and a Software Implementations of AES. FDTC 2012: 7-15 - [c7]Ronan Lashermes, Guillaume Reymond, Jean-Max Dutertre, Jacques J. A. Fournier, Bruno Robisson, Assia Tria:
A DFA on AES Based on the Entropy of Error Distributions. FDTC 2012: 34-43 - [c6]Jean-Max Dutertre, Amir-Pasha Mirbaha, David Naccache, Anne-Lise Ribotta, Assia Tria, Thierry Vaschalde:
Fault Round Modification Analysis of the advanced encryption standard. HOST 2012: 140-145 - [i1]Amine Dehbaoui, Jean-Max Dutertre, Bruno Robisson, P. Orsatelli, Philippe Maurine, Assia Tria:
Injection of transient faults using electromagnetic pulses -Practical results on a cryptographic system-. IACR Cryptol. ePrint Arch. 2012: 123 (2012) - 2011
- [j1]Jacques J. A. Fournier, Jean-Baptiste Rigaud, Sylvain Bouquet, Bruno Robisson, Assia Tria, Jean-Max Dutertre, Michel Agoyan:
Design and characterisation of an AES chip embedding countermeasures. Int. J. Intell. Eng. Informatics 1(3/4): 328-347 (2011) - [c5]Marion Doulcier-Verdier, Jean-Max Dutertre, Jacques J. A. Fournier, Jean-Baptiste Rigaud, Bruno Robisson, Assia Tria:
A side-channel and fault-attack resistant AES circuit working on duplicated complemented values. ISSCC 2011: 274-276 - 2010
- [c4]Michel Agoyan, Jean-Max Dutertre, David Naccache, Bruno Robisson, Assia Tria:
When Clocks Fail: On Critical Paths and Clock Faults. CARDIS 2010: 182-193 - [c3]Michel Agoyan, Jean-Max Dutertre, Amir-Pasha Mirbaha, David Naccache, Anne-Lise Ribotta, Assia Tria:
How to flip a bit? IOLTS 2010: 235-239 - [c2]Jean-Baptiste Rigaud, Jean-Max Dutertre, Michel Agoyan, Bruno Robisson, Assia Tria:
Experimental Fault Injection based on the Prototyping of an AES Cryptosystem. ReCoSoC 2010: 141-147
2000 – 2009
- 2001
- [c1]Jean-Max Dutertre, F. M. Roche, Guy Cathébras:
Integration of Robustness in the Design of a Cell. VLSI-SOC 2001: 229-239
Coauthor Index
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last updated on 2024-09-21 02:41 CEST by the dblp team
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