Yuanhang ChengSiyu Isaac Parker TianZekun RenSelvaraj VenkatarajYuanhang ChengDaniil BashFelipe OviedoJ. Senthilnath 0001Vijila ChellappanYee-Fun LimArmin G. AberleBenjamin P. MacLeodFraser G. L. ParlaneCurtis P. BerlinguetteQianxiao LiTonio BuonassisiZhe LiuTransfer Learning for Rapid Extraction of Thickness from Optical Spectra of Semiconductor Thin Films.2022abs/2207.02209CoRRhttps://doi.org/10.48550/arXiv.2207.02209db/journals/corr/corr2207.html#abs-2207-02209Armin AberleArmin G. AberleDaniil BashCurtis P. BerlinguetteTonio BuonassisiVijila ChellappanQianxiao LiYee-Fun LimZhe LiuBenjamin P. MacLeodFelipe OviedoFraser G. L. ParlaneZekun RenJ. Senthilnath 0001Siyu I. P. TianSiyu Isaac Parker TianSelvaraj Venkataraj