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dblp: Paul Salmen

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Paul Salmen

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2023
[c3]
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  - conf/irps/FeilWRBASRGG23
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Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Judith Berens, Thomas Aichinger, Paul Salmen, Gerald Rescher, Wolfgang Gustin, Tibor Grasser:
Towards Understanding the Physics of Gate Switching Instability in Silicon Carbide MOSFETs. IRPS 2023: 1-10
[c2]
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Christian Schwabe, Xing Liu, Tobias N. Wassermann, Paul Salmen, Thomas Basler:
SiC MOSFET threshold voltage stability during power cycling testing and the impact on the result interpretation. IRPS 2023: 1-6
2021
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Paul Salmen, Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Gerald Rescher, Thomas Aichinger:
A new test procedure to realistically estimate end-of-life electrical parameter stability of SiC MOSFETs in switching operation. IRPS 2021: 1-7

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