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Link to original content: https://dblp.org/rec/journals/tvlsi/YiYISKF12.xml
Hyunbean Yi Tomokazu Yoneda Michiko Inoue Yasuo Sato Seiji Kajihara Hideo Fujiwara A Failure Prediction Strategy for Transistor Aging. 1951-1959 2012 20 IEEE Trans. Very Large Scale Integr. Syst. 11 https://doi.org/10.1109/TVLSI.2011.2165304 db/journals/tvlsi/tvlsi20.html#YiYISKF12