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Link to original content: https://dblp.org/rec/journals/tvlsi/YiYISKF12.rdf
Hyunbean Yi et al.: A Failure Prediction Strategy for Transistor Aging. (2012) journals/tvlsi/YiYISKF12 10.1109/TVLSI.2011.2165304 A Failure Prediction Strategy for Transistor Aging. 6 Hyunbean Yi 1 Tomokazu Yoneda 2 Michiko Inoue 3 Yasuo Sato 4 Seiji Kajihara 5 Hideo Fujiwara 6 1951-1959 IEEE Trans. Very Large Scale Integr. Syst. IEEE Trans. Very Large Scale Integr. Syst. 20 11 2012 provenance information for RDF data of dblp record 'journals/tvlsi/YiYISKF12' 2020-03-11T18:18:23+0100