Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
Content:text/plain; charset="utf-8"
TY - JOUR
ID - DBLP:journals/tvlsi/RitheCGWDGBC12
AU - Rithe, Rahul
AU - Chou, Sharon
AU - Gu, Jie
AU - Wang, Alice
AU - Datla, Satyendra
AU - Gammie, Gordon
AU - Buss, Dennis
AU - Chandrakasan, Anantha P.
TI - The Effect of Random Dopant Fluctuations on Logic Timing at Low Voltage.
JO - IEEE Trans. Very Large Scale Integr. Syst.
VL - 20
IS - 5
SP - 911
EP - 924
PY - 2012//
DO - 10.1109/TVLSI.2011.2124477
UR - https://doi.org/10.1109/TVLSI.2011.2124477
ER -
