Stelios Neophytou Maria K. Michael Test Pattern Generation of Relaxed n-Detect Test Sets. 410-423 2012 20 IEEE Trans. Very Large Scale Integr. Syst. 3 https://doi.org/10.1109/TVLSI.2010.2102056 db/journals/tvlsi/tvlsi20.html#NeophytouM12