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https://dblp.org/rec/journals/tvlsi/NakamuraCSF07.nt
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"Yoshiyuki Nakamura et al.: Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester. (2007)" .
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_:ID_2e3c1987ba6a511c90c011e1ff35ea1d . _:ID_2e3c1987ba6a511c90c011e1ff35ea1d
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"journals/tvlsi/NakamuraCSF07" .
_:ID_26b76e7e757314998c523ff97785a4bb . _:ID_26b76e7e757314998c523ff97785a4bb
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"10.1109/TVLSI.2007.899235" .
"Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester." .
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"4"^^
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_:Sig_1b1e3864aefdec607da230bef3c98561_1 . _:Sig_1b1e3864aefdec607da230bef3c98561_1
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"Yoshiyuki Nakamura" . _:Sig_1b1e3864aefdec607da230bef3c98561_1
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"1"^^
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_:Sig_1b1e3864aefdec607da230bef3c98561_2 . _:Sig_1b1e3864aefdec607da230bef3c98561_2
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"Thomas Clouqueur" . _:Sig_1b1e3864aefdec607da230bef3c98561_2
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"2"^^
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_:Sig_1b1e3864aefdec607da230bef3c98561_3 . _:Sig_1b1e3864aefdec607da230bef3c98561_3
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"Kewal K. Saluja" . _:Sig_1b1e3864aefdec607da230bef3c98561_3
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"3"^^
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_:Sig_1b1e3864aefdec607da230bef3c98561_4 . _:Sig_1b1e3864aefdec607da230bef3c98561_4
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"Hideo Fujiwara" . _:Sig_1b1e3864aefdec607da230bef3c98561_4
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"4"^^
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"790-800" .
"IEEE Trans. Very Large Scale Integr. Syst." .
"IEEE Trans. Very Large Scale Integr. Syst." .
"15" .
"7" .
"2007"^^
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"provenance information for RDF data of dblp record 'journals/tvlsi/NakamuraCSF07'" .
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"2020-03-11T18:18:27+0100" .