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https://dblp.org/rec/journals/tvlsi/HuangL12.nt
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"Yu-Jen Huang and Jin-Fu Li: Low-Cost Self-Test Techniques for Small RAMs in SOCs Using Enhanced IEEE 1500 Test Wrappers. (2012)" .
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_:ID_58f537d26eabba8130eb637ac4def040 . _:ID_58f537d26eabba8130eb637ac4def040
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"journals/tvlsi/HuangL12" .
_:ID_5993401bd01c6ac445b0d54135234734 . _:ID_5993401bd01c6ac445b0d54135234734
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"10.1109/TVLSI.2011.2165568" .
"Low-Cost Self-Test Techniques for Small RAMs in SOCs Using Enhanced IEEE 1500 Test Wrappers." .
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"2"^^
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_:Sig_b68df29518824a3d8e841e3d6eb57ffc_1 . _:Sig_b68df29518824a3d8e841e3d6eb57ffc_1
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"Yu-Jen Huang" . _:Sig_b68df29518824a3d8e841e3d6eb57ffc_1
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"1"^^
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_:Sig_b68df29518824a3d8e841e3d6eb57ffc_2 . _:Sig_b68df29518824a3d8e841e3d6eb57ffc_2
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"Jin-Fu Li 0001" . _:Sig_b68df29518824a3d8e841e3d6eb57ffc_2
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"2"^^
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"2123-2127" .
"IEEE Trans. Very Large Scale Integr. Syst." .
"IEEE Trans. Very Large Scale Integr. Syst." .
"20" .
"11" .
"2012"^^
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"provenance information for RDF data of dblp record 'journals/tvlsi/HuangL12'" .
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"2023-10-17T15:22:33+0200" .
