Muhammad Muqarrab BashirChang-Chih ChenLinda MilorDae Hyun Kim 0004Sung Kyu LimBackend Dielectric Reliability Full Chip Simulator.1750-1762201422IEEE Trans. Very Large Scale Integr. Syst.8https://doi.org/10.1109/TVLSI.2013.2277856db/journals/tvlsi/tvlsi22.html#BashirCMKL14