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Link to original content: https://dblp.org/rec/journals/tvlsi/0002JH14.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - JOUR ID - DBLP:journals/tvlsi/0002JH14 AU - Feng, Zhe AU - Jing, Naifeng AU - He, Lei TI - IPF: In-Place X-Filling Algorithm for the Reliability of Modern FPGAs. JO - IEEE Trans. Very Large Scale Integr. Syst. VL - 22 IS - 10 SP - 2225 EP - 2228 PY - 2014// DO - 10.1109/TVLSI.2013.2282819 UR - https://doi.org/10.1109/TVLSI.2013.2282819 ER -