Ramanath Subramanyam and Mayuram S. Krishnan: Empirical Analysis of CK Metrics for Object-Oriented Design Complexity: Implications for Software Defects. (2003)journals/tse/SubramanyamK0310.1109/TSE.2003.1191795Empirical Analysis of CK Metrics for Object-Oriented Design Complexity: Implications for Software Defects.2Ramanath Subramanyam1Mayuram S. Krishnan2297-310IEEE Trans. Software Eng.IEEE Trans. Software Eng.2942003provenance information for RDF data of dblp record 'journals/tse/SubramanyamK03'2017-05-17T10:56:37+0200