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https://dblp.org/rec/journals/tos/LiuWCZWLX22.nt
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"Weihua Liu et al.: Characterization Summary of Performance, Reliability, and Threshold Voltage Distribution of 3D Charge-Trap NAND Flash Memory. (2022)" .
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_:ID_446934457f63ec8495a648e5ebbd2685 . _:ID_446934457f63ec8495a648e5ebbd2685
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"journals/tos/LiuWCZWLX22" .
_:ID_73969fc52a624d019c45a0fa8e4ff11a . _:ID_73969fc52a624d019c45a0fa8e4ff11a
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"10.1145/3491230" .
_:ID_630899d65aea51bd7b5013ff5dd9c610 . _:ID_630899d65aea51bd7b5013ff5dd9c610
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"Q114141217" .
"Characterization Summary of Performance, Reliability, and Threshold Voltage Distribution of 3D Charge-Trap NAND Flash Memory." .
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"7"^^
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_:Sig_07c1d403daed4bc858fee8a4474685c9_1 . _:Sig_07c1d403daed4bc858fee8a4474685c9_1
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"Weihua Liu" . _:Sig_07c1d403daed4bc858fee8a4474685c9_1
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"1"^^
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_:Sig_07c1d403daed4bc858fee8a4474685c9_2 . _:Sig_07c1d403daed4bc858fee8a4474685c9_2
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"Fei Wu 0005" . _:Sig_07c1d403daed4bc858fee8a4474685c9_2
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"2"^^
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_:Sig_07c1d403daed4bc858fee8a4474685c9_3 . _:Sig_07c1d403daed4bc858fee8a4474685c9_3
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"Xiang Chen" . _:Sig_07c1d403daed4bc858fee8a4474685c9_3
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"3"^^
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_:Sig_07c1d403daed4bc858fee8a4474685c9_4 . _:Sig_07c1d403daed4bc858fee8a4474685c9_4
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"Meng Zhang 0014" . _:Sig_07c1d403daed4bc858fee8a4474685c9_4
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"4"^^
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_:Sig_07c1d403daed4bc858fee8a4474685c9_5 . _:Sig_07c1d403daed4bc858fee8a4474685c9_5
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"Yu Wang 0002" . _:Sig_07c1d403daed4bc858fee8a4474685c9_5
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"5"^^
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_:Sig_07c1d403daed4bc858fee8a4474685c9_6 . _:Sig_07c1d403daed4bc858fee8a4474685c9_6
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"Xiangfeng Lu" . _:Sig_07c1d403daed4bc858fee8a4474685c9_6
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"6"^^
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_:Sig_07c1d403daed4bc858fee8a4474685c9_7 . _:Sig_07c1d403daed4bc858fee8a4474685c9_7
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"Changsheng Xie" . _:Sig_07c1d403daed4bc858fee8a4474685c9_7
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"7"^^
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"16:1-16:25" .
"ACM Trans. Storage" .
"ACM Trans. Storage" .
"18" .
"2" .
"2022"^^
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"provenance information for RDF data of dblp record 'journals/tos/LiuWCZWLX22'" .
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"2024-07-19T09:25:41+0200" .