Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
Content:text/plain; charset="utf-8"
TY - JOUR
ID - DBLP:journals/tim/XiaLXLXTW24
AU - Xia, Yuanlin
AU - Liu, Yuan
AU - Xia, Yinfeng
AU - Liu, Wenfeng
AU - Xia, Cao
AU - Tan, Jiaxing
AU - Wang, Zhuqing
TI - Toughness Measurement of Microscale Coating/Silicon MEMS System Using Pillar Splitting Method.
JO - IEEE Trans. Instrum. Meas.
VL - 73
SP - 1
EP - 11
PY - 2024//
DO - 10.1109/TIM.2024.3403192
UR - https://doi.org/10.1109/TIM.2024.3403192
ER -
