Chih-Hung Jen et al.: Data-Driven Virtual Metrology and Retraining Systems for Color Filter Processes of TFT-LCD Manufacturing. (2022)journals/tim/JenFL2210.1109/TIM.2022.3207807Data-Driven Virtual Metrology and Retraining Systems for Color Filter Processes of TFT-LCD Manufacturing.3Chih-Hung Jen1Shu-Kai S. Fan2Yu-Yu Lin31-12IEEE Trans. Instrum. Meas.IEEE Trans. Instrum. Meas.712022provenance information for RDF data of dblp record 'journals/tim/JenFL22'2022-10-18T22:17:25+0200