Min Li et al.: An Integrated Model-Data-Based Zero-Phase Error Tracking Feedforward Control Strategy With Application to an Ultraprecision Wafer Stage. (2017)journals/tie/LiZYHM1710.1109/TIE.2016.2562606Q59894936An Integrated Model-Data-Based Zero-Phase Error Tracking Feedforward Control Strategy With Application to an Ultraprecision Wafer Stage.5Min Li 00161Yu Zhu 00012Kaiming Yang3Chuxiong Hu4Haihua Mu54139-4149IEEE Trans. Ind. Electron.IEEE Trans. Ind. Electron.6452017provenance information for RDF data of dblp record 'journals/tie/LiZYHM17'2020-11-04T08:42:50+0100