Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
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TY - JOUR
ID - DBLP:journals/scjapan/YamadaN92
AU - Yamada, Teruhiko
AU - Nakamura, Yoshiyuki
TI - A method of diagnosing single stuck-at faults in combinational circuits.
JO - Syst. Comput. Jpn.
VL - 23
IS - 14
SP - 35
EP - 44
PY - 1992//
DO - 10.1002/SCJ.4690231404
UR - https://doi.org/10.1002/scj.4690231404
ER -