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Link to original content: https://dblp.org/rec/journals/scjapan/YamadaN92.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - JOUR ID - DBLP:journals/scjapan/YamadaN92 AU - Yamada, Teruhiko AU - Nakamura, Yoshiyuki TI - A method of diagnosing single stuck-at faults in combinational circuits. JO - Syst. Comput. Jpn. VL - 23 IS - 14 SP - 35 EP - 44 PY - 1992// DO - 10.1002/SCJ.4690231404 UR - https://doi.org/10.1002/scj.4690231404 ER -