Gabriele Navarro Sarra Souiki Alain Persico Veronique Sousa Jean-François Nodin Carine Jahan François Aussenac Vincent Delaye Olga Cueto Luca Perniola Barbara De Salvo High temperature reliability of μtrench Phase-Change Memory devices. 1928-1931 2012 52 Microelectron. Reliab. 9-10 https://doi.org/10.1016/j.microrel.2012.06.017 db/journals/mr/mr52.html#NavarroSPSNJADCPS12
