Samson MelamedNaoya WatanabeShunsuke NemotoHaruo ShimamotoKatsuya KikuchiMasahiro AoyagiImpact of thinning stacked dies on the thermal resistance of bump-bonded three-dimensional integrated circuits.2-8201667Microelectron. Reliab.https://doi.org/10.1016/j.microrel.2016.08.015db/journals/mr/mr67.html#MelamedWNSKA16