iBet uBet web content aggregator. Adding the entire web to your favor.
iBet uBet web content aggregator. Adding the entire web to your favor.



Link to original content: https://dblp.org/rec/journals/mr/ChoiBJIWUM16.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - JOUR ID - DBLP:journals/mr/ChoiBJIWUM16 AU - Choi, Ui-Min AU - Blaabjerg, Frede AU - Jørgensen, Søren AU - Iannuzzo, Francesco AU - Wang, Huai AU - Uhrenfeldt, Christian AU - Munk-Nielsen, Stig TI - Power cycling test and failure analysis of molded Intelligent Power IGBT Module under different temperature swing durations. JO - Microelectron. Reliab. VL - 64 SP - 403 EP - 408 PY - 2016// DO - 10.1016/J.MICROREL.2016.07.020 UR - https://doi.org/10.1016/j.microrel.2016.07.020 ER -